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01/28/2022
Testable Array Multipliers for a Better Utilization of C-Testability and Bijectivity
This paper presents a design for test (DFT)architecture for fast and sca...
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11/22/2017
Test Generation and Scheduling for a Hybrid BIST Considering Test Time and Power Constraint
This paper presents a novel approach for test generation and test schedu...
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11/22/2017
