research
∙
11/23/2022
Characterizing a Neutron-Induced Fault Model for Deep Neural Networks
The reliability evaluation of Deep Neural Networks (DNNs) executed on Gr...
share
research
∙
05/24/2022
Reliability Assessment of Neural Networks in GPUs: A Framework For Permanent Faults Injections
Currently, Deep learning and especially Convolutional Neural Networks (C...
research
∙
12/30/2021
Comparing different solutions for testing resistive defects in low-power SRAMs
Low-power SRAM architectures are especially sensitive to many types of d...
research
∙
09/02/2021
A Novel Compaction Approach for SBST Test Programs
In-field test of processor-based devices is a must when considering safe...
research
∙
03/11/2021
Exploring the Mysteries of System-Level Test
System-level test, or SLT, is an increasingly important process step in ...
research
∙
11/29/2019
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
The recent trends for nanoelectronic computing systems include machine-t...
research
∙
09/01/2019
